Topic: Confocal Microscopy & Toolmark Analysis September 21st, 8:30 a.m. - 5:00 p.m.

[Bill Wheatley]

‘Confocal Microscopy & Toolmark Analysis:

Pushing out the Frontiers of Forensic Science’
Nicholas Petraco, Ph.D., Associate Professor

John Jay College of Criminal Justice NYC

September 21st, 8:30 a.m. - 5:00 p.m.

[Nick Petraco Jr]

All are welcome and refreshments will be served.

The event is all day Tuesday Sept 21 (8:30am-5:30pm) and will be taking place at the John Jay "BMW Building" space:

555 West 57th Street, 6th Floor, Room 616 (Bring photo ID in case you are asked to sign in)

Several measuring microscopes will be on display for demo and use. Bring in your samples! These scopes tend to be expensive so this is a great place to come and try them out and see if they would be beneficial to firearms and tool mark analysis work. The specific scopes that will be there are:

Olympus LEXT 405nm Laser Confocal Microscope
Olympus BX51 Compound Microscope
Olympus GX51 Inverted Metallograph
Olympus SZX16 Stereo Zoom Microscope
Olympus SZ61TR Stereo Zoom Microscope
Olympus FV10i Confocal Laser Scanning Microscope
Hirox KH-770 3D Digital Microscope

The two applications talks noted by Bill above will be at 10:00am and 1:00pm for those interested.

Just for disclosure: We have no commercial interest in Olympus or Hirox. This seminar is for demonstration/information/education purposes only.

[Jerryp]

Thanks Nick

[Bill Wheatley]

Nick,

I just would like to take this opportunity to thank you, Pete Diaczuk and the Science Dept at John Jay for hosting so many great educational seminars and training courses at John Jay.  When Jerry Petillo and I were teaching the Serial Number Restoration Course for BATFE in NYC this past March it was John Jay that stepped up to the plate and provided us with a phenomenal facility that not only met the requirements to host the course but exceeded them, to include two chemical control officers through out the entire length of the course. It's cooperation like this between educational institutions like yours and practitioners in the forensic disciplines that makes for a great learning experience had by all. You, Pete and the members of your department are a true asset to our field

Thank You Again

Bill