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Author Topic: TWG3D2T - Best Practice Guide for QC of 3D Instruments for VCM  (Read 4927 times)

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Offline Alan Zheng

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TWG3D2T - Best Practice Guide for QC of 3D Instruments for VCM
« on: November 05, 2024, 11:05:58 AM »

Hi everyone. I'd like to announce that the first best practice document has been completed. Thank you all for your patience as we developed and vetted this document through our working group and public comments. I'd like to thank all those involved. As always, please feel free to get in touch with us if you have any questions.


"Best Practice Guide for the Calibration and Quality Control of 3D Surface Topography Measurement Instruments Used for Virtual Comparison Microscopy (VCM)"


Scope: This best practice guide describes the calibration, verification, and monitoring of 3D surface topography measurement instrument metrological characteristics that may affect virtual comparison microscopy (VCM) of toolmarks. Best practice requires calibration or verification of these metrological characteristics before the application of instrument measurement data to VCM. This guide provides quality control procedures to detect significant changes in the metrological characteristics relative to their calibrated state. This guidance document is applicable to the development of a quality control system for a single 3D surface topography measurement instrument.

https://twg3d2t.org/documents/
« Last Edit: November 05, 2024, 11:13:20 AM by Alan Zheng »

 

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